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"Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack."

Yueyang Liu et al. (2019)

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DOI: 10.1109/IRPS.2019.8720414

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/irps/LiuJWEW19
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  - https://dblp.org/rec/conf/irps/LiuJWEW19
Yueyang Liu, Xiangwei Jiang, Liwei Wang, Yunfei En, Runsheng Wang:
Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. IRPS 2019: 1-4

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