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"Reliability Qualification Challenges of SOCs in Advanced CMOS Process ..."
Shou-En Liu et al. (2022)
- Shou-En Liu, Jian Li, Deepak Nayak, Amit Marathe, Kaushik Balamukundhan, Vishal Gosavi, Ajaykumar Prajapati, Baha Kilic, Mengzhi Pang, Arpit Mittal:
Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited). IRPS 2022: 8
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