"Reliability Qualification Challenges of SOCs in Advanced CMOS Process ..."

Shou-En Liu et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764426

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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Shou-En Liu, Jian Li, Deepak Nayak, Amit Marathe, Kaushik Balamukundhan, Vishal Gosavi, Ajaykumar Prajapati, Baha Kilic, Mengzhi Pang, Arpit Mittal:
Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited). IRPS 2022: 8

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