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"Effect of Residual TiN on Reliability of Au Wire Bonds during High ..."

John M. McGlone et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128891

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

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  dblp key:
  - conf/irps/McGloneBVIHG20
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  - https://dblp.org/rec/conf/irps/McGloneBVIHG20
John M. McGlone, Guy Brizar, Daniel Vanderstraeten, Dorai Iyer, Sallie Hose, Jeff P. Gambino:
Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage. IRPS 2020: 1-5

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