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"Accurate screening of defective oxide on SiC using consecutive multiple ..."
Hiroshi Miki et al. (2022)
- Hiroshi Miki, M. Sagawa, Y. Mori, T. Murata, K. Kinoshita, K. Asaka, T. Oda:
Accurate screening of defective oxide on SiC using consecutive multiple threshold-voltage measurements. IRPS 2022: 8
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