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"Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced ..."

Vinayak Bharat Naik et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764563

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-16

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  dblp key:
  - conf/irps/NaikLYKBCKHCCHP22
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  - https://dblp.org/rec/conf/irps/NaikLYKBCKHCCHP22
Vinayak Bharat Naik, J. H. Lim, Kazutaka Yamane, J. Kwon, Behin-Aein B., N. L. Chung, S. K, R. Chao, C. Chiang, Y. Huang, L. Pu, Yuichi Otani, Suk Hee Jang, Nivetha Balasankaran, Wah-Peng Neo, T. Ling, Jia Wen Ting, Hongsik Yoon, Johannes Müller, Bert Pfefferling, Oliver Kallensee, Thomas Merbeth, Chim Seng Seet, J. Wong, Y. S. You, Steven Soss, T. H. Chan, S. Y. Siah:
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. IRPS 2022: 6

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