"Comprehensive Analysis of Deep level Effects and in-situ Photoionization ..."

Francesco de Pieri et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983862

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Francesco de Pieri, Manuel Fregolent, Marco Saro, Andrea Carlotto, Mirco Boito, Carlo De Santi, Fabiana Rampazzo, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni:
Comprehensive Analysis of Deep level Effects and in-situ Photoionization in 0.15 $\mu \mathrm{m}$ buffer-free AIGaN/GaN HEMTs for RF applications. IRPS 2025: 1-5

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