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"Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from ..."

Victor M. van Santen et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117751

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez, Rafael Castro-López, Elisenda Roca, Hussam Amrouch:
Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. IRPS 2023: 1-6

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