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"Challenges to realize highly reliable SiC power devices: From the current ..."
Junji Senzaki et al. (2018)
- Junji Senzaki, Shohei Hayashi, Yoshiyuki Yonezawa, Hajime Okumura:
Challenges to realize highly reliable SiC power devices: From the current status and issues of SiC wafers. IRPS 2018: 3
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