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"Multi-cell soft errors at the 16-nm FinFET technology node."
N. Tam et al. (2015)
- N. Tam, Bharat L. Bhuva, Lloyd W. Massengill, Dennis R. Ball, Michael W. McCurdy, Michael L. Alles, Indranil Chatterjee
:
Multi-cell soft errors at the 16-nm FinFET technology node. IRPS 2015: 4
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