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"Novel Cumulative Degradation Approach to Predict Components Failure Rates."

George Thiel, Flavio Griggio (2019)

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DOI: 10.1109/IRPS.2019.8720495

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/ThielG19
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  - https://dblp.org/rec/conf/irps/ThielG19
George Thiel, Flavio Griggio:
Novel Cumulative Degradation Approach to Predict Components Failure Rates. IRPS 2019: 1-7

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