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"Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) ..."
Taiki Uemura et al. (2024)
- Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae:
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. IRPS 2024: 1-6
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