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"Investigation of alpha-induced single event transient (SET) in 10 nm ..."

Taiki Uemura et al. (2018)

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DOI: 10.1109/IRPS.2018.8353689

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/UemuraLMMLLSP18
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  - https://dblp.org/rec/conf/irps/UemuraLMMLLSP18
Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae:
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. IRPS 2018: 1

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