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"Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging."
Takuya Wadatsumi et al. (2022)
- Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Takuji Miki
, Makoto Nagata, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo:
Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging. IRPS 2022: 14-1
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