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"Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar ..."

Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan (2020)

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DOI: 10.1109/IRPS45951.2020.9128343

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan:
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise. IRPS 2020: 1-5

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