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"Reliability of 200mm E-mode GaN-on-Si Power HEMTs."

David C. Zhou et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129220

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-18

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  dblp key:
  - conf/irps/ZhouLSCZLZCCZW20
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  persistent URL:
  - https://dblp.org/rec/conf/irps/ZhouLSCZLZCCZW20
David C. Zhou, William Li, Jingyu Shen, Leilei Chen, Thomas Zhao, Kent Lin, Martin Zhang, Larry Chen, H. C. Chiu, Jeff Zhang, Roy K.-Y. Wong:
Reliability of 200mm E-mode GaN-on-Si Power HEMTs. IRPS 2020: 1-3

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