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"Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based ..."
Luchang Ding et al. (2022)
- Luchang Ding, Chang Cai, Gengsheng Chen, Zehao Wu, Jing Zhang, Chang Wu, Jun Yu:
Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based on the Simulation and Irradiation Results. ISCAS 2022: 2281-2285
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