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"ESD protection design in a 0.18-um salicide CMOS technology by using ..."

Ming-Dou Ker, Tung-Yang Chen, Chung-Yu Win (2001)

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DOI: 10.1109/ISCAS.2001.922347

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Ming-Dou Ker, Tung-Yang Chen, Chung-Yu Win:
ESD protection design in a 0.18-um salicide CMOS technology by using substrate-triggered technique. ISCAS (4) 2001: 754-757

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