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"A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of ..."

Yukiya Miura, Sachio Naito, Kozo Kinoshita (1994)

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DOI: 10.1109/ISCAS.1994.409304

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Yukiya Miura, Sachio Naito, Kozo Kinoshita:
A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit. ISCAS 1994: 77-80

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