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"Impact of CNT process imperfection on circuit-level functionality and yield."

Kaship Sheikh, Shu-Jen Han, Lan Wei (2016)

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DOI: 10.1109/ISCAS.2016.7527255

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-01

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Kaship Sheikh, Shu-Jen Han, Lan Wei:
Impact of CNT process imperfection on circuit-level functionality and yield. ISCAS 2016: 401-404

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