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"A framework to study time-dependent variability in circuits at sub-35nm ..."
Tong Boon Tang et al. (2012)
- Tong Boon Tang
, Alan F. Murray, Binjie Cheng, Asen Asenov:
A framework to study time-dependent variability in circuits at sub-35nm technology nodes. ISCAS 2012: 1568-1571
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