"The Bayesian Analysis of Reliability of Electrical Products."

Shao-hua Jin et al. (2008)

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DOI: 10.1109/ISCSCT.2008.32

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iscsct/JinLWS08
Shao-hua Jin, Jian-guo Lu, Yan-ping Wan, Shu-guang Sun:
The Bayesian Analysis of Reliability of Electrical Products. ISCSCT (1) 2008: 430-433

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