Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Enhancing Reliability of Combinational Circuits against Soft Errors by ..."

Aiman H. El-Maleh, Feras Chikh Oughali (2013)

> Home

Details and statistics

DOI: 10.1109/ISED.2013.19

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ised/El-MalehO13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ised/El-MalehO13
Aiman H. El-Maleh, Feras Chikh Oughali:
Enhancing Reliability of Combinational Circuits against Soft Errors by Using a Generalized Modular Redundancy Scheme. ISED 2013: 62-66

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.