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"Identifying Faulty TSVs in 3D Stacked IC during Pre-bond Testing."

Surajit Kumar Roy, Sobitri Chatterjee, Chandan Giri (2012)

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DOI: 10.1109/ISED.2012.49

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/ised/RoyCG12
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  - https://dblp.org/rec/conf/ised/RoyCG12
Surajit Kumar Roy, Sobitri Chatterjee, Chandan Giri:
Identifying Faulty TSVs in 3D Stacked IC during Pre-bond Testing. ISED 2012: 162-166

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