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"Co-mitigating circuit PBTI and HCI aging considering NMOS transistor ..."

Maoxiang Yi et al. (2016)

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DOI: 10.1109/ISICIR.2016.7829675

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  dblp key:
  - conf/isicir/YiGHL16
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  - https://dblp.org/rec/conf/isicir/YiGHL16
Maoxiang Yi, Yingxian Gan, Zhengfeng Huang, Huaguo Liang:
Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect. ISIC 2016: 1-5

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