default search action
"Advanced thermal sensing circuit and test techniques used in a high ..."
David E. Duarte et al. (2007)
- David E. Duarte, Greg Taylor, Keng L. Wong, Usman Mughal, George L. Geannopoulos:
Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor. ISLPED 2007: 304-309
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.