"Asymmetric issues of FinFET device after hot carrier injection and impact ..."

Chenyue Ma et al. (2010)

> Home

Details and statistics

DOI: 10.1109/ISQED.2010.5450542

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isqed/MaWZHHZL10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isqed/MaWZHHZL10
Chenyue Ma, Hao Wang, Xiufang Zhang, Frank He, Yadong He, Xing Zhang, Xinnan Lin:
Asymmetric issues of FinFET device after hot carrier injection and impact on digital and analog circuits. ISQED 2010: 432-436

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.