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"Reliability analysis of analog circuits by lifetime yield prediction using ..."

Xin Pan, Helmut Graeb (2010)

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DOI: 10.1109/ISQED.2010.5450477

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Xin Pan, Helmut Graeb:
Reliability analysis of analog circuits by lifetime yield prediction using worst-case distance degradation rate. ISQED 2010: 861-865

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