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"Integrating Yield, Test and Reliability: "Statistical Models with ..."

Adit D. Singh (2003)

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DOI: 10.1109/ISQED.2003.10006

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Adit D. Singh:
Integrating Yield, Test and Reliability: "Statistical Models with Applications to Test and Burn-in Optimization". ISQED 2003: 7

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