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"Capacitively coupled non-contact probing circuits for membrane-based ..."
Mutsuo Daito et al. (2010)
- Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai:
Capacitively coupled non-contact probing circuits for membrane-based wafer-level simultaneous testing. ISSCC 2010: 144-145
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