"An Event-Based Gate-Level Framework for Power Side-Channel Leakage Assessment."

Katayoon Basharkhah, Zahra Hojati, Zainalabedin Navabi (2025)

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DOI: 10.1109/ISVLSI65124.2025.11130249

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-02

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Katayoon Basharkhah, Zahra Hojati, Zainalabedin Navabi:
An Event-Based Gate-Level Framework for Power Side-Channel Leakage Assessment. ISVLSI 2025: 1-6

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