"The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test ..."

Chung-Huang Yeh, Jwu E. Chen (2020)

> Home

Details and statistics

DOI: 10.1109/ITC-ASIA51099.2020.00027

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc-asia/YehC20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc-asia/YehC20
Chung-Huang Yeh, Jwu E. Chen:
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. ITC-Asia 2020: 88-93

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.