"Power-Aware Test Scheduling for Memory BIST."

Albert Au et al. (2024)

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DOI: 10.1109/ITC51657.2024.00060

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Albert Au, Michal Kçpinski, Makary Orczyk, Artur Pogiel:
Power-Aware Test Scheduling for Memory BIST. ITC 2024: 384-390

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