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"Efficient Scan Chain Design for Power Minimization During Scan Testing ..."
Yannick Bonhomme et al. (2003)
- Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch:
Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC 2003: 488-493
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