"Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon ..."

Wu-Tung Cheng et al. (2025)

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DOI: 10.1109/ITC58126.2025.00044

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza:
Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. ITC 2025: 367-376

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