"Adaptive test selection for post-silicon timing validation: A data mining ..."

Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng (2012)

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DOI: 10.1109/TEST.2012.6401540

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng:
Adaptive test selection for post-silicon timing validation: A data mining approach. ITC 2012: 1-7

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