"Scan Chain Diagnosis in Advanced Process Nodes: The Art of Balancing ..."

Sandeep Kumar Goel et al. (2025)

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DOI: 10.1109/ITC58126.2025.00040

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Sandeep Kumar Goel, Ankita Patidar, Yue Tian, Frank Lee:
Scan Chain Diagnosis in Advanced Process Nodes: The Art of Balancing Resolution, Repairability, and Cost. ITC 2025: 330-338

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