"Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data ..."

Chen He, Rebecca Chen, Patrick Goertz (2025)

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DOI: 10.1109/ITC58126.2025.00077

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Chen He, Rebecca Chen, Patrick Goertz:
Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data Augmented Training. ITC 2025: 510-513

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