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"Test Generation with High Coverages for Quiescent Current Test of Bridging ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Eugeni Isern, Joan Figueras (1993)

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DOI: 10.1109/TEST.1993.470716

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-20

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  dblp key:
  - conf/itc/IsernF93
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  persistent URL:
  - https://dblp.org/rec/conf/itc/IsernF93
Eugeni Isern, Joan Figueras:
Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits. ITC 1993: 73-82

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