"Test Pattern Generation for Circuits with Three-state Modules by Improved ..."

Noriyoshi Itazaki, Kozo Kinoshita (1986)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-10-22

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Noriyoshi Itazaki, Kozo Kinoshita:
Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm. ITC 1986: 105-112

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