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"A Unified Theory for Designing Optimal Test Generation and Diagnosis ..."

Najmi T. Jarwala, Chi W. Yau (1989)

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DOI: 10.1109/TEST.1989.82279

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/JarwalaY89a
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  - https://dblp.org/rec/conf/itc/JarwalaY89a
Najmi T. Jarwala, Chi W. Yau:
A Unified Theory for Designing Optimal Test Generation and Diagnosis Algorithms for Board Interconnects. ITC 1989: 71-77

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