"Test evaluation and data on defect-oriented BIST architecture for ..."

Seongwon Kim, Mani Soma (2001)

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DOI: 10.1109/TEST.2001.966705

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Seongwon Kim, Mani Soma:
Test evaluation and data on defect-oriented BIST architecture for high-speed PLL. ITC 2001: 830-837

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