"A Built-In Test Methodology for VLSI Data Paths."

Charles R. Kime et al. (1984)

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams:
A Built-In Test Methodology for VLSI Data Paths. ITC 1984: 327-337

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