"Optimal Scheduling of Signature Analysis for VLSI Testing."

C. Mani Krishna, Yann-Hang Lee (1988)

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DOI: 10.1109/TEST.1988.207755

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type: Conference or Workshop Paper

metadata version: 2022-09-10

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C. Mani Krishna, Yann-Hang Lee:
Optimal Scheduling of Signature Analysis for VLSI Testing. ITC 1988: 443-451

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