"Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate ..."

Norio Kuji, Teruo Tamama (1985)

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Norio Kuji, Teruo Tamama:
Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. ITC 1985: 643-651

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