"Unit level predicted yield: a method of identifying high defect density ..."

Russell B. Miller, Walter C. Riordan (2001)

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DOI: 10.1109/TEST.2001.966738

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Russell B. Miller, Walter C. Riordan:
Unit level predicted yield: a method of identifying high defect density die at wafer sort. ITC 2001: 1118-1127

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