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"Hierarchical Test Generation Using Precomputed Tests for Modules."

Brian T. Murray, John P. Hayes (1988)

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DOI: 10.1109/TEST.1988.207806

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Brian T. Murray, John P. Hayes:
Hierarchical Test Generation Using Precomputed Tests for Modules. ITC 1988: 221-229

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