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"Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous ..."
Benoit Nadeau-Dostie, Kiyoshi Takeshita, Jean-Francois Cote (2008)
- Benoit Nadeau-Dostie, Kiyoshi Takeshita, Jean-Francois Cote:
Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks. ITC 2008: 1-10
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