"A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates."

K. E. Newman, David C. Keezer (1997)

Details and statistics

DOI: 10.1109/TEST.1997.639639

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.