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"Bitline contacts in high density SRAMs: design for testability and ..."
Harold Pilo et al. (2001)
- Harold Pilo, R. Dean Adams, Robert E. Busch, Eric A. Nelson, Geoerge E. Rudgers:
Bitline contacts in high density SRAMs: design for testability and stressability. ITC 2001: 776-782
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