"A reusable BIST with software assisted repair technology for improved ..."

Bruce Querbach et al. (2014)

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DOI: 10.1109/TEST.2014.7035340

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Bruce Querbach, Rahul Khanna, David Blankenbeckler, Yulan Zhang, Ronald T. Anderson, David G. Ellis, Zale T. Schoenborn, Sabyasachi Deyati, Patrick Chiang:
A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. ITC 2014: 1-10

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